4.4 out of 5 stars with 9 reviews
Phase II PHT1100G-01 Calibrated Leeb Test Block for "G" Probe Impact Device
List Price
$289.47
Our Price
$275.00
Savings
5% OFF
* Pricing Information Updated Less Then A Minute Ago
Applications Portable hardness test for metals. |
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Minimum Thickness of Sample Coupled: 310mm
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Minimum Weight of Sample Of Compact Shape: 15kg, On Solid Point: 5kg
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All "G" Type Impact Devices
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Portable hardness test for metals.
Product Information Specifications for Phase II PHT1100G-01 Calibrated Leeb Test Block for "G" Probe Impact Device Below:
Manufacturer | Phase II Plus |
Brand | Phase II Plus |
Model | PHT1100G-01 |
Item Weight | 1 pounds |
Units in Package | 1 |
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