Product Details
4.4 out of 5 stars with 9 reviews

Phase II PHT1100G-01 Calibrated Leeb Test Block for "G" Probe Impact Device


List Price
$289.47
Our Price
$275.00
Savings
5% OFF
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Applications Portable hardness test for metals.
  • Minimum Thickness of Sample Coupled: 310mm

  • Minimum Weight of Sample Of Compact Shape: 15kg, On Solid Point: 5kg

  • All "G" Type Impact Devices

  • Portable hardness test for metals.

Product Information   Specifications for Phase II PHT1100G-01 Calibrated Leeb Test Block for "G" Probe Impact Device Below:

Manufacturer Phase II Plus
Brand Phase II Plus
Model PHT1100G-01
Item Weight 1 pounds
Units in Package 1

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